High-resolution scanning probe microscope

SPM-9700HTHigh-resolution scanning probe microscopeAtomic force microscopy (AFM) involves scanning the surface of a sample with a tiny probe to observe the three-dimensional morphology and local physical properties at high magnification.

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SPM-9700HT

High-resolution scanning probe microscope

Atomic force microscopy (AFM) involves scanning the surface of a sample with a tiny probe to observe the three-dimensional morphology and local physical properties at high magnification.

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